On achieving a complete fault coverage for sequential machines using the transition fault model

Proceedings - Design Automation Conference

Volumn , Issue , 1991, Pages 341-346

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

SWITCHING THEORY--SEQUENTIAL SWITCHING;

TEST PATTERN GENERATION; TRANSITION FAULT MODEL;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0026175222     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/127601.127691     Document Type: Conference Paper

References (9)