Molecular resolution of zeolite surfaces as imaged by atomic force microscopy

Zeolites

Volumn 11, Issue 5, 1991, Pages 429-433

  MacDougall, James E ^a   Cox, Sherman D ^a   Stucky, Galen D ^a   Weisenhorn, Albrecht L ^a   Hansma, Paul K ^a   Wise, William S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Atomic force microscopy; faujasite; scolecite; stilbite; surfaces; zeolite crystals

Indexed keywords

MOLECULAR SIEVES--SURFACES; SURFACES--MICROSCOPIC EXAMINATION;

ATOMIC FORCE MICROSCOPY;

ZEOLITES;

EID: 0026170423     PISSN: 01442449     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0144-2449(05)80112-5     Document Type: Article

References (34)

1. Preface
2. Methodologies to establish the structure and composition of new zeolitic molecular sieves
3. Atomic Force Microscope
4. Atomic Resolution with Atomic Force Microscope
5. Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on silicon
6. Imaging and modification of polymers by scanning tunneling and atomic force microscopy
7. Atomic force microscopy using optical interferometry
8. From atoms to integrated circuit chips, blood cells, and bacteria with the atomic force microscope
9. Refinement of the crystal structure of stilbite