Simple Analytical Expressions for the Fringing Field and Fringing-Field-Induced Transfer Time in Charge-Coupled Devices

IEEE Transactions on Electron Devices

Volumn 38, Issue 5, 1991, Pages 1152-1161

  Bakker, Jacques G C ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS;

BULK CCD; FRINGING FIELDS; SURFACE CCD;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0026155687     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.78393     Document Type: Article

References (10)

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