Study of interface structure of the oxide grown on nickel alloys by APFIM

Applied Surface Science

Volumn 48-49, Issue C, 1991, Pages 227-230

  Ren, D G ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES, ION; OXIDES - INTERFACES; SURFACES - MICROSCOPIC EXAMINATION;

FIELD ION MICROSCOPE ATOM PROBES; INTERFACE STRUCTURE;

NICKEL CHROMIUM SILICON ALLOYS;

EID: 0026153626     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(91)90335-H     Document Type: Article

References (1)

1. Ultrahigh-resolution chemical analysis with the atom probe