메뉴 건너뛰기




Volumn 38, Issue 4, 1991, Pages 840-851

Monte Carlo Simulation of Short-Channel Heterostructure Field-Effect Transistors

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL STATISTICS--MONTE CARLO METHODS; PHYSICS--SOLID STATE;

EID: 0026142483     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.75214     Document Type: Article
Times cited : (23)

References (42)
  • 1
    • 0343157554 scopus 로고
    • Calculation of the electron velocity distribution in high mobility transistors using an ensemble Monte Carlo method
    • T. Wang and K. Hess, “Calculation of the electron velocity distribution in high mobility transistors using an ensemble Monte Carlo method,” J. Appl. Phys., vol. 57, p. 5336, 1985.
    • (1985) J. Appl. Phys , vol.57 , pp. 5336
    • Wang, T.1    Hess, K.2
  • 3
    • 84914093213 scopus 로고
    • Monte Carlo simulation of self-aligned heterostmcture Al GaAs/GaAs field effect transistors
    • J. J. H. Miller, Ed. Dublin: Boole Press Ltd.
    • G. U. Jensen, T. A. Fjeldly, and M. Shur, “Monte Carlo simulation of self-aligned heterostmcture Al GaAs/GaAs field effect transistors,” in Proc. 6th Int. Nasecode Conference, J. J. H. Miller, Ed. Dublin: Boole Press Ltd., 1989, p. 232.
    • (1989) Proc. 6th Int. Nasecode Conference , pp. 232
    • Jensen, G.U.1    Fjeldly, T.A.2    Shur, M.3
  • 4
    • 84907812115 scopus 로고
    • Dependence on gate length of electrical properties of self-aligned Al GaAs/GaAs HEMTs studied by Monte Carlo technique
    • Berlin, Germany
    • G. U. Jensen, B. Lund, T. A. Fjeldly, and M. Shur, “Dependence on gate length of electrical properties of self-aligned Al GaAs/GaAs HEMTs studied by Monte Carlo technique,” in Proc. ESSDERC 89 (Berlin, Germany, 1989), p. 615.
    • (1989) Proc. ESSDERC 89 , pp. 615
    • Jensen, G.U.1    Lund, B.2    Fjeldly, T.A.3    Shur, M.4
  • 5
    • 11944260928 scopus 로고
    • Supercomputer images of electron device physics
    • Feb.
    • K. Hess, “Supercomputer images of electron device physics,” Physics Today, pp. 34–42, Feb. 1990.
    • (1990) Physics Today , pp. 34-42
    • Hess, K.1
  • 7
    • 0024753983 scopus 로고
    • Short-channel effects in subquarter-micrometer-gate HEMT’s: Simulation and experiments
    • Y. Awano, M. Kosugi, K. Kosemura, T. Mimura, and M. Abe, “Short-channel effects in subquarter-micrometer-gate HEMT’s: Simulation and experiments,” IEEE Trans. Electron Devices, vol. 36, p. 2260, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2260
    • Awano, Y.1    Kosugi, M.2    Kosemura, K.3    Mimura, T.4    Abe, M.5
  • 8
    • 0024173327 scopus 로고
    • Short channel effects in submicron self-aligned aligned gate heterostructure field effect transistors
    • (Washington, DC, Dec.
    • C. J. Han, P. P. Ruden, D. Grider, A. Fraasch, K. Newstrom, P. Joslyn, and M. Shur, “Short channel effects in submicron self-aligned aligned gate heterostructure field effect transistors,” in IEDM Tech. Dig. (Washington, DC, Dec. 1988), p. 696.
    • (1988) IEDM Tech. Dig. , pp. 696
    • Han, C.J.1    Ruden, P.P.2    Grider, D.3    Fraasch, A.4    Newstrom, K.5    Joslyn, P.6    Shur, M.7
  • 11
    • 0022101366 scopus 로고
    • Modeling for an AlGaAs/GaAs heterostructure device using Monte Carlo simulation
    • M. Tomizawa, A. Yoshii, and K. Yokoyama, “Modeling for an AlGaAs/GaAs heterostructure device using Monte Carlo simulation,” IEEE Electron Device Lett., vol. ED L -6, p. 332, 1985.
    • (1985) IEEE Electron Device Lett. , vol.ED-6 , pp. 332
    • Tomizawa, M.1    Yoshii, A.2    Yokoyama, K.3
  • 12
    • 0022683311 scopus 로고
    • MODFET ensemble Monte Carlo model including the quasi-two-dimensional electron gas
    • U. Ravaioli and D. K. Ferry, -MODFET ensemble Monte Carlo model including the quasi-two-dimensional electron gas,” IEEE Trans. Electron Devices, vol, ED-33, p. 667, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 667
    • Ravaioli, U.1    Ferry, D.K.2
  • 13
    • 84939709213 scopus 로고
    • Performance of a quarter-micrometre-gate ballistic electron HEMT
    • Y. Awano, M. Kosugi, T. Mimura, and M. Abe, “Performance of a quarter-micrometre-gate ballistic electron HEMT,” IEEE Electron Device Lett., vol. EDL-8, 451, 1987.
    • (1987) IEEE Electron Device Lett. , vol.EDL-8 , pp. 451
    • Awano, Y.1    Kosugi, M.2    Mimura, T.3    Abe, M.4
  • 14
    • 0024048584 scopus 로고
    • Ensemble Monte Carlo simulation of an AlGaAs/GaAs heterostructure MIS-like FET
    • K. Tomizawa and N. Hashizume, “Ensemble Monte Carlo simulation of an AlGaAs/GaAs heterostructure MIS-like FET,” IEEE Trans. Electron Devices, vol. 35, p. 849, 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , pp. 849
    • Tomizawa, K.1    Hashizume, N.2
  • 15
    • 0025401212 scopus 로고
    • Monte Carlo simulation of 0.35-μm gate-length GaAs and InGaAs HEMT’s
    • D. H. Park and K. F. Brennan, “Monte Carlo simulation of 0.35 µm gate-length GaAs and InGaAs HEMT’s,” IEEE Trans. Electron Devices, vol. 37, 618, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 618
    • Park, D.H.1    Brennan, K.F.2
  • 16
    • 0021458935 scopus 로고
    • Two-dimensional numerical analysis of the high electron mobility transistor
    • D. J. Widiger, K. Hess, and J. J. Coleman, “Two-dimensional numerical analysis of the high electron mobility transistor,” IEEE Electron Device Lett., vol. EDL-5, p. 266, 1984.
    • (1984) IEEE Electron Device Lett. , vol.EDL-5 , pp. 266
    • Widiger, D.J.1    Hess, K.2    Coleman, J.J.3
  • 17
    • 0022079882 scopus 로고
    • Two-dimensional transient simulation of an idealized high Electron mobility transistor
    • D. J. Widiger, I. C. Kizilyalli, K. Hess, and J. J. Coleman, “Two-dimensional transient simulation of an idealized high Electron mobility transistor,” IEEE Trans. Electron Devices, vol. ED-32, 32, p. 1092, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , Issue.32 , pp. 1092
    • Widiger, D.J.1    Kizilyalli, I.C.2    Hess, K.3    Coleman, J.J.4
  • 18
    • 0001582597 scopus 로고
    • Monte Carlo study of electronic transport in Al-x GaAs/GaAs single-well heterostructures
    • K. Yokoyama and K. Hess, “Monte Carlo study of electronic transport in Al, _ x GaAs/GaAs single-well heterostructures,” Phys. Rev. B, vol. 33, p. 5595, 1986.
    • (1986) Phys. Rev. B , vol.33 , pp. 5595
    • Yokoyama, K.1    Hess, K.2
  • 19
    • 0023307826 scopus 로고
    • Electron velocity at high electric fields in AlGaAs/GaAs modulation-doped heterostructures
    • presented at 5th Int. Conf. on HCIS, Boston, 1987, also in Solid-State Electron.
    • W. Masselink, N. Braslau, D. LaTulipe, W. Wang, and S. Wright, “Electron velocity at high electric fields in AlGaAs/GaAs modulation-doped heterostructures,” presented at 5th Int. Conf. on HCIS, Boston, 1987, also in Solid-State Electron., vol. 31, p. 337, 1988.
    • (1988) , vol.31 , pp. 337
    • Masselink, W.1    Braslau, N.2    LaTulipe, D.3    Wang, W.4    Wright, S.5
  • 20
    • 79952002427 scopus 로고
    • New mechanism of gate current in hetero-structure structure insulated gate field-effect transistor
    • J. Baek, M. Shur, R. R. Daniels, D. K. Arch, J. K. Abrokwah, and O. N. Tufte, “New mechanism of gate current in hetero-structure structure insulated gate field-effect transistor,” IEEE Electron Device Lett. vol. EDL-7, p. 519, 1986.
    • (1986) IEEE Electron Device Lett. , vol.EDL-7 , pp. 519
    • Baek, J.1    Shur, M.2    Daniels, R.R.3    Arch, D.K.4    Abrokwah, J.K.5    Tufte, O.N.6
  • 21
    • 0019071932 scopus 로고
    • Monte Carlo simulation of real-space space electron transfer in GaAs-AlGaAs heterostructures
    • T. H. Glisson, J. R. Hauser, M. A. Littlejohn, K. Hess, B. G. Streetman, and H. Shichijo, “Monte Carlo simulation of real-space space electron transfer in GaAs-AlGaAs heterostructures,” J. Appl. Phys., vol. 51, p. 5445, 1980.
    • (1980) J. Appl. Phys. , vol.51 , pp. 5445
    • Glisson, T.H.1    Hauser, J.R.2    Littlejohn, M.A.3    Hess, K.4    Streetman, B.G.5    Shichijo, H.6
  • 22
    • 0018444725 scopus 로고
    • Carrier transport across heterojunction interfaces
    • C. M. Wu and E. S. Yang, “Carrier transport across hetero junctiontion interfaces,” Solid-State Electron., vol. 22, p. 241, 1979.
    • (1979) Solid-State Electron. , vol.22 , pp. 241
    • Wu, C.M.1    Yang, E.S.2
  • 23
    • 5544279923 scopus 로고
    • Monte Carlo simulation of Si and GaAs avalanche electron emitting diodes
    • J. M. Higman, K. Kim, K. Hess, T. van Zutphen, and H. M. J. Boots, “Monte Carlo simulation of Si and GaAs avalanche electron emitting diodes,” J. Appl. Phys., vol. 65, p. 1384, 1989.
    • (1989) J. Appl. Phys. , vol.65 , pp. 1384
    • Higman, J.M.1    Kim, K.2    Hess, K.3    van Zutphen, T.4    Boots, H.M.J.5
  • 24
    • 84939757995 scopus 로고
    • Monte Carlo simulation of III-V semiconductor devices
    • Ph.D. dissertation, Norwegian Institute of Technology, Trondheim
    • G. U. Jensen, “Monte Carlo simulation of III-V semiconductor devices,” Ph.D. dissertation, Norwegian Institute of Technology, Trondheim, 1989.
    • (1989)
    • Jensen, G.U.1
  • 26
    • 0025251482 scopus 로고
    • Unified charge control model and subthreshold current in heterostructure field effect transistors
    • Y. H. Byun, K. Lee, and M. Shur, “Unified charge control model and subthreshold current in heterostructure field effect transistors,” IEEE Electron Device Lett., vol. 11, p. 50, 1990.
    • (1990) IEEE Electron Device Lett. , vol.11 , pp. 50
    • Byun, Y.H.1    Lee, K.2    Shur, M.3
  • 27
    • 0025416050 scopus 로고
    • New contin-uous heterostructure field effect transistor model and unified parameter extraction technique
    • B. J. Moon, Y. H. Byun, K. R. Lee, and M Shur, “New contin-uous heterostructure field effect transistor model and unified parameter extraction technique,” IEEE Trans. Electron Devices, vol. 37, p. 908, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 908
    • Moon, B.J.1    Byun, Y.H.2    Lee, K.R.3    Shur, M.4
  • 28
    • 0004572750 scopus 로고
    • (Sov. Phys-Semicond., vol. 6, p. 1204, 1973).
    • Z. S. Gtibnikov, Fiz. Tekh, Poluprovodn., vol. 6, no. 7, p. 1380, 1972 (Sov. Phys-Semicond., vol. 6, p. 1204, 1973).
    • (1972) Fiz. Tekh, Poluprovodn. , vol.6 , Issue.7 , pp. 1380
    • Gtibnikov, Z.S.1
  • 32
    • 84939713339 scopus 로고
    • New CHINT transistor
    • presented at WOC-SEMMAD-90, SEMMAD-90, San Francisco, Feb.
    • N. Moll et al., “New CHINT transistor,” presented at WOC-SEMMAD-90, SEMMAD-90, San Francisco, Feb. 1990.
    • (1990)
    • Moll, N.1
  • 33
    • 0022668993 scopus 로고
    • New negative resistance regime of heterostructure insulated gate transistor (HIGFET) operation
    • M. Shur, D. K. Arch, R. R. Daniels, and J. K. Abrokwah, “New negative resistance regime of heterostructure insulated gate transistor (HIGFET) operation,” IEEE Electron Device Lett., vol. EDL-7, pp. 78–80, 1986.
    • (1986) IEEE Electron Device Lett. , vol.EDL-7 , pp. 78-80
    • Shur, M.1    Arch, D.K.2    Daniels, R.R.3    Abrokwah, J.K.4
  • 34
    • 0024612020 scopus 로고
    • Distributive nature of gate current and negative transconductance in heterostructure field-effect transistors
    • P. P. Ruden, M. Shur, A. I. Akinwande, and P. Jenkins, “Distributive nature of gate current and negative transconductance in heterostructure field-effect transistors,” IEEE Trans. Electron Devices, vol. 36, p. 453, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 453
    • Ruden, P.P.1    Shur, M.2    Akinwande, A.I.3    Jenkins, P.4
  • 35
    • 0023547602 scopus 로고
    • Bias-dependent microwave characteristics of an atomic planar-doped AlGaAs/InGaAs/GaAs Double Heterojunction MODFET
    • Las Vegas, NV, June
    • Y. K. Chen, D. C. Radulescu, G. W. Wang, A. N. Lepore, P. J. Tasker, L. F. Eastman, and E. Strid, “Bias-dependent microwave characteristics of an atomic planar-doped AlGaAs/InGaAs/GaAs Double Heterojunction MODFET,” in Proc. IEEE MTT Symp. (Las Vegas, NV, June 1987), p. 871.
    • (1987) Proc. IEEE MTT Symp. , pp. 871
    • Chen, Y.K.1    Radulescu, D.C.2    Wang, G.W.3    Lepore, A.N.4    Tasker, P.J.5    Eastman, L.F.6    Strid, E.7
  • 36
    • 0018047210 scopus 로고
    • A technique for predicting large-signal performance of a GaAs MESFET
    • H. A. Willing, C. Rauscher, and P. de Santis, “A technique for predicting large-signal performance of a GaAs MESFET,” IEEE Trans. Microwave Theory Tech., vol. MTT-26, p. 1017, 1978.
    • (1978) IEEE Trans. Microwave Theory Tech. , vol.MTT-26 , pp. 1017
    • Willing, H.A.1    Rauscher, C.2    de Santis, P.3
  • 37
    • 84939770824 scopus 로고
    • Monte-Carlo simulation of the effects induced by real-space transfer in a HEMT
    • B. Källbäck and H. Beneking, Eds. New York:
    • M. Mouis, P. Dolfus, B. Mougel, J.-F. Pone, and R. Castagne, “Monte-Carlo simulation of the effects induced by real-space transfer in a HEMT,” in High Speed Electronics, B. ‘Callback and H. Beneking, Eds. New York: 1986, 35.
    • (1986) High Speed Electronics , pp. 35
    • Mouis, M.1    Dolfus, P.2    Mougel, B.3    Pone, J.F.4    Castagné, R.5
  • 38
    • 0001427570 scopus 로고
    • Selectively 6-doped Al, Gai As/GaAs heterostructures with high two-dimensional electron-gas concentrations n2DEG ≥ 1.5 x 1012 cm-2 for field-effect transistors
    • E. F. Schubert, J. E. Cunningham, W. T. Tsang, and G. L. Timp, “Selectively 6-doped Al, Gai As/GaAs heterostructures with high two-dimensional electron-gas concentrations n2DEG ≧ 1.5 x 1012 cm-2 for field-effect transistors,” Appl. Phys. Lett., vol. 51, p. 1170, 1987.
    • (1987) Appl. Phys. Lett. , vol.51 , pp. 1170
    • Schubert, E.F.1    Cunningham, J.E.2    Tsang, W.T.3    Timp, G.L.4
  • 40
    • 0020717268 scopus 로고
    • Current-voltage voltage and capacitance-voltage characteristics of modulation-doped doped field-effect transistors
    • K. Lee, M. S. Shur, T. J. Drummond, and H. Morkoc, “Current-voltage voltage and capacitance-voltage characteristics of modulation-doped doped field-effect transistors,” IEEE Trans. Electron Devices, vol. ED-30, p. 207, 1983.
    • (1983) IEEE Trans. Electron Devices , vol.ED-30 , pp. 207
    • Lee, K.1    Shur, M.S.2    Drummond, T.J.3    Morkoc, H.4
  • 42
    • 0024749939 scopus 로고
    • A new fabrication technology for Al GaAs/GaAs HEMT LSI’s using In GaAs nonalloyed ohmic contacts
    • S. Kuroda, N. Harada, T. Katakami, T. Mimura, and M. Abe, “A new fabrication technoloev for AlGaAs/GaAs HEMT LSI’s using InGaAs nonalloyed ohmic contacts,” IEEE Trans. Electron Devices, vol. 36, p. 2196, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2196
    • Kuroda, S.1    Harada, N.2    Katakami, T.3    Mimura, T.4    Abe, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.