Failure rate model for thin film cracking in plastic ICs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1991, Pages 22-29

  Blish, R C ^a   Vaney, P R ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS--FAILURE; MATHEMATICAL TECHNIQUES--FINITE ELEMENT METHOD; PLASTICS;

THIN FILM CRACKING;

INTEGRATED CIRCUITS;

EID: 0026141273     PISSN: 00999512     EISSN: None     Source Type: None    
DOI: 10.1109/irps.1991.363206     Document Type: Conference Paper

References (23)