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Volumn 6, Issue 2, 1991, Pages 824-832

Life Tests on Vacuum Switches Breaking 50 Ka Unidirectional Current

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CIRCUIT BREAKERS--RELIABILITY;

EID: 0026140132     PISSN: 08858977     EISSN: 19374208     Source Type: Journal    
DOI: 10.1109/61.131141     Document Type: Article
Times cited : (13)

References (8)
  • 1
    • 0024087960 scopus 로고
    • DC Breaking Tests up to 55 kA in a Single Vacuum Interrupter
    • I.Benfatto, A.Maschio, S.Manganaro, “DC Breaking Tests up to 55 kA in a Single Vacuum Interrupter”, IEEE Transactions on Power Delivery, vol. 3 n. 4, 1988, pp. 1732–1738.
    • (1988) IEEE Transactions on Power Delivery , vol.3 , Issue.4 , pp. 1732-1738
    • Benfatto, I.1    Maschio, A.2    Manganaro, S.3
  • 6
    • 0024069135 scopus 로고
    • Calculation of Eddy-Current-Induced Magnetic Fields in Vacuum Interrupters with Axial Magnetic Field Contacts
    • B.J.Paul, “Calculation of Eddy-Current-Induced Magnetic Fields in Vacuum Interrupters with Axial Magnetic Field Contacts” IEEE Transactions on Magnetics, vol. 24 n. 5, 1988, pp. 2204–2214.
    • (1988) IEEE Transactions on Magnetics , vol.24 , Issue.5 , pp. 2204-2214
    • Paul, B.J.1
  • 7
    • 0023223629 scopus 로고
    • Arc Behavior on Vacuum Switching Contacts with Axial Magnetic Field
    • R.Gebel, D.Falkenberg, “Arc Behavior on Vacuum Switching Contacts with Axial Magnetic Field”, Siemens Forsch. u. Entwickl.-Ber., Bd. 16 n. 2, 1987, pp. 72–75.
    • (1987) Siemens Forsch. u. Entwickl.-Ber. , vol.16 , Issue.2 , pp. 72-75
    • Gebel, R.1    Falkenberg, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.