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Volumn , Issue , 1991, Pages 206-213
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Reliability aspects of commercial AlGaAs/GaAs HEMTs
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM AND ALLOYS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR DEVICES, MESFET;
TITANIUM AND ALLOYS;
THERMAL ACTIVATION;
TRANSISTORS, HIGH ELECTRON MOBILITY;
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EID: 0026139720
PISSN: 00999512
EISSN: None
Source Type: None
DOI: 10.1109/irps.1991.363235 Document Type: Conference Paper |
Times cited : (11)
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References (22)
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