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Volumn 6, Issue 2, 1991, Pages 228-239

Thermal Parameter Estimation Using Recursive Identification

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORKS; MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES - STATE SPACE METHODS;

EID: 0026135785     PISSN: 08858993     EISSN: 19410107     Source Type: Journal    
DOI: 10.1109/63.76809     Document Type: Article
Times cited : (57)

References (18)
  • 1
    • 84941479821 scopus 로고
    • Power semiconductor ratings under transient and intermittent loads
    • F. Gutzwiller and T. Sylvan, “Power semiconductor ratings under transient and intermittent loads,” in Rec. AIEE Winter Meeting, 1959.
    • (1959) Rec. AIEE Winter Meeting
    • Gutzwiller, F.1    Sylvan, T.2
  • 3
    • 84941468538 scopus 로고
    • How to power rate a transistor
    • Mar./Apr.
    • R. Chick, “How to power rate a transistor,” Solid State Power Conv., Mar./Apr. 1977.
    • (1977) Solid State Power Conv.
    • Chick, R.1
  • 4
    • 84941435961 scopus 로고
    • Transistor safe operating area
    • “Transistor safe operating area,” Amperex Report S169, 1981.
    • (1981) Amperex Report S169
  • 6
    • 0024891322 scopus 로고
    • Improved dc modeling of high current bipolar transistors for accurate converter simulation
    • R. Prest and J. Van Wyk, “Improved dc modeling of high current bipolar transistors for accurate converter simulation,” in IEEE IAS Annual Conf. Rec., 1989, 1235.
    • (1989) IEEE IAS Annual Conf. Rec.
    • Prest, R.1    Van Wyk, J.2
  • 7
    • 0024887566 scopus 로고
    • Development of a secondary breakdown model for bipolar transistors
    • S. Menhart and W. Portnoy, “Development of a secondary breakdown model for bipolar transistors,” in IEEE IAS Annual Conf. Rec., 1989, p. 1243.
    • (1989) IEEE IAS Annual Conf. Rec. , pp. 1243
    • Menhart, S.1    Portnoy, W.2
  • 8
    • 84941475112 scopus 로고    scopus 로고
    • Adaptive current regulators to maximize overload capability
    • G. Skibinski, W. Sethares, and D. Divan, “Adaptive current regulators to maximize overload capability,” Wempec notes.
    • Wempec notes.
    • Skibinski, G.1    Sethares, W.2    Divan, D.3
  • 12
    • 84941470360 scopus 로고
    • Thermal resistance measurements of conduction cooled power transistors
    • 1975 Electronic Industry Association, 2001 Eye Street, N.W., Washington, DC 20006.
    • “Thermal resistance measurements of conduction cooled power transistors,” EIA Standard RS-313-13, 1975 Electronic Industry Association, 2001 Eye Street, N.W., Washington, DC 20006.
    • (1975) EIA Standard RS-313-13
  • 15
    • 84941467589 scopus 로고
    • Persistant excitation and parameter convergence.
    • Lectures on Adaptive Parameter Estimation, Lecture 5, NJ: Prentice Hall
    • C. Johnson, Lectures on Adaptive Parameter Estimation, Lecture 5, “Persistant excitation and parameter convergence.” Englewood Cliffs, NJ: Prentice Hall, 1988.
    • (1988) Englewood Cliffs
    • Johnson, C.1
  • 16
    • 84941472898 scopus 로고    scopus 로고
    • Mitchell & Gauthier Assoc., Concord, MA.
    • ACSL Ref. Manual, Mitchell & Gauthier Assoc., Concord, MA.
    • ACSL Ref. Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.