Phase measurement interferometric microscopy of thin films: Analysis of topography, refractive index, and thickness of solvent swollen polystyrene films

Thin Solid Films

Volumn 198, Issue 1-2, 1991, Pages 369-386

  Smith, C P ^a   Fritz, D C ^a   Tirrell, M ^a   White, H S ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT--REFRACTION; MICROSCOPIC EXAMINATION;

PHASE MEASUREMENT INTERFEROMETRIC MICROSCOPY; REFRACTIVE INDEX;

POLYSTYRENES;

EID: 0026123535     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(91)90355-2     Document Type: Article

References (18)

1. Measurement of surface topography of magnetic tapes by Mirau interferometry
2. Scanned-Probe Microscopes