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Surface and Interface Analysis

Volumn 17, Issue 3, 1991, Pages 125-136

Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether

(4) Fowler, David E a Johnson, Roboert D a Vanleyen, Dieter b Benninghoven, Alfred b

a IBM ALMADEN RESEARCH CENTER (United States)

b UNIVERSITY OF MÜNSTER (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORINE CONTAINING POLYMERS - SPECTROSCOPIC ANALYSIS; IONS; MASS SPECTROMETRY;

PERFLUORINATED POLYETHERS; TIME OF FLIGHT SPECTROMETRY;

POLYETHERS;

EID: 0026121694 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740170303 Document Type: Article

Times cited : (41)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.