Cutting the high cost of testing

IEEE Spectrum

Volumn 28, Issue 3, 1991, Pages 48-51

  Michael Souders, T ^a   Stenbakken, Gerard N ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA CONVERSION, ANALOG TO DIGITAL; MICROPROCESSOR CHIPS - TESTING;

ERROR SIGNATURE; INTEGRAL NONLINEARITY; NORMALIZED PREDICTION VARIANCE; QR FACTORIZATION; RESIDUAL ERRORS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0026118855     PISSN: 00189235     EISSN: None     Source Type: Journal    
DOI: 10.1109/6.67285     Document Type: Article

References (0)