Determination of Intrinsic Fet Parameters Using Circuit Partitioning Approach

IEEE Transactions on Microwave Theory and Techniques

Volumn 39, Issue 2, 1991, Pages 363-366

  Vickes, Hans Olof ^a  

^a ERICSSON RADIO SYSTEMS AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVES; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CHARGE ACCUMULATION; CIRCUIT PARTITIONING APPROACH; COMPOUND SEMICONDUCTOR FET; INTRINSIC FET PARAMETERS; MODFET; PARAMETER EXTRACTION;

TRANSISTORS, FIELD EFFECT;

EID: 0026107986     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.102985     Document Type: Article

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