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Volumn 37, Issue 4, 1991, Pages 623-627
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Effects of ionising radiation on the noise properties of electron devices and monolithic circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
RADIATION CHEMISTRY;
TRANSISTORS, FIELD EFFECT--RADIATION EFFECTS;
EQUIVALENT NOISE CHARGE (ENC);
FRONT-END PREAMPLIFIERS;
INPUT EQUIVALENT NOISE CHARGE (ENC);
IONIZING RADIATION;
LOW-NOISE CIRCUITS;
INTEGRATED CIRCUITS, MONOLITHIC;
CONFERENCE PAPER;
CONTROLLED STUDY;
ELECTRONICS;
INSTRUMENTATION;
IONIZING RADIATION;
NOISE;
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EID: 0026073877
PISSN: 01465724
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (7)
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