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Volumn 60, Issue 4, 1991, Pages 777-785
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Electrostatic interaction in atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
ATOMIC FORCE MICROSCOPY;
MICROSCOPY;
PRIORITY JOURNAL;
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EID: 0026038548
PISSN: 00063495
EISSN: None
Source Type: Journal
DOI: 10.1016/S0006-3495(91)82112-9 Document Type: Article |
Times cited : (207)
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References (0)
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