Determination of Interface State Density in Small-Geometry MOSFET’s by High-Low-Frequency Transconductance Method

IEEE Electron Device Letters

Volumn 12, Issue 1, 1991, Pages 13-15

  Chen, Hung Sheng ^a   Li, Sheng S ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES--APPLICATIONS; SEMICONDUCTOR MATERIALS--DOPING;

INTERFACE STATE DENSITY; TRANSCONDUCTANCE;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025997799     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.75682     Document Type: Article

References (8)

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