Notch and large-area CCD imagers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1447, Issue , 1991, Pages 310-315

  Bredthauer, Richard A ^a   Pinter, Jeff H ^a   Janesick, James R ^a   Robinson, Lloyd B ^a  

^a California Institute of Technology

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES--EQUIPMENT; SEMICONDUCTOR DEVICES, CHARGE COUPLED--RADIATION DAMAGE;

CHARGE CONFINEMENT; CHARGE TRANSFER EFFICIENCY; DOPED CHANNELS; HIGH-RESOLUTION CCD IMAGERS; NOTCH AND LARGE-AREA CCD IMAGERS; TWO-DIMENSIONAL THEORETICAL ANALYSIS;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0025901310     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)