Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits

Nuclear Tracks and Radiation Measurements

Volumn 19, Issue 1-4, 1991, Pages 929-938

  McNulty, P J ^a   Roth, D R ^a   Beauvais, W J ^a   Abdel Kader, W G ^a   Dinge, D C ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA STORAGE, DIGITAL--RANDOM ACCESS; PROTONS;

SINGLE EVENT UPSETS(SEU); SOFTWARE PACKAGE CUPID;

MICROELECTRONICS;

EID: 0025843236     PISSN: 0191278X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)