Evaluation of the sp2/sp3 ratio in amorphous carbon structure by XPS and XAES

Applied Surface Science

Volumn 47, Issue 1, 1991, Pages 17-21

  Lascovich, J C ^a   Giorgi, R ^a   Scaglione, S ^a  

^a ENEA C R CASACCIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS--HYDROGENATION; ION BEAMS--EFFECTS; SPECTROSCOPY, AUGER ELECTRON--APPLICATIONS; SPECTROSCOPY, PHOTOELECTRON--APPLICATIONS; SURFACES--SPECTROSCOPIC ANALYSIS;

AMORPHOUS CARBON FILMS; CARBON ATOM BOND HYBRIDIZATION; HYDROGENATED AMORPHOUS CARBON FILMS; ION BEAM SPUTTERED CARBON FILMS; X-RAY AUGER ELECTRON SPECTROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY;

CARBON;

EID: 0025840808     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(91)90098-5     Document Type: Article

References (16)

1. Transparent carbon films: Comparison of properties between ion- and plasma-deposition processes
2. Bonding in hydrogenated hard carbon studied by optical spectroscopy
3. The diamond surface
4. The C KLL first-derivative x-ray photoelectron spectroscopy spectra as a fingerprint of the carbon state and the characterization of diamondlike carbon films
5. Surface analysis of diamondlike carbon films