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Volumn 1447, Issue , 1991, Pages 109-122
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Backside-thinned CCDs for keV electron detection
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC MEASUREMENTS--VOLTAGE;
IMAGING TECHNIQUES;
RADIATION DAMAGE;
SEMICONDUCTOR DEVICES--PERFORMANCE;
BACKSIDE-THINNED CCD'S;
CHARGE TRANSFER EFFICIENCY (CTE);
DEVICE RADIATION TOLERANCE;
EBS GAIN;
ELECTRO-BOMBARDED-SEMICONDUCTOR (EBS) IMAGERS;
KEV ELECTRON DETECTION;
SEMICONDUCTOR DEVICES, CHARGE COUPLED;
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EID: 0025759647
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (26)
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