Time domain analysis of skin effect on lossy interconnections

Electronics Letters

Volumn 26, Issue 25, 1990, Pages 2057-2058

  Vu Dinh, T ^a   Cabon, B ^a   Chilo, J ^a  

^a Unto BP257 ^*  (France)

Author keywords

Skin effect

Indexed keywords

ELECTRIC NETWORKS - ANALYSIS; MICROSTRIP DEVICES;

LOSSY INTERCONNECTIONS;

ELECTRIC CONDUCTORS;

EID: 0025701929     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19901327     Document Type: Article

References (6)

1. Vu dinh, T., Cabon, B., and Chilo, J.: ‘New Skin Effect Equivalent Circuit’ Electron. Lett., 1990, 26, (19), Pp. 1582-1584
2. Johnson, R. R.: ‘Multichip Modules: Next Generation Packages’ IEEE Spectrum, March 1990, Pp. 34-48
3. Ruehli, A. E.: ‘Inductance Calculations In A Complex Integrated Circuits Environment’ Ibm J. Res Dev., 1972, Pp. 470-480
4. Wei, C, Harrington, R. F., Mautz, J. R., and Sarkar, T. R.: ‘Multiconductor Transmission Lines In Multilayers Dielectric Media’ IEEE Trans. Mtt, April 1984, 32, Pp. 439-450
5. Bose, S., and Bhattacharyya, B. K.: ‘Time Domain Method For Optimizing Transmission Line Model’ Ieps 8Th International Electronics Packaging Conference, Dallas, 1988, Pp. 637-664
6. Chilo, J., Monllor, C., and Bouthinon, M. : ‘Interconnection Effects In Fast Logic Integrated Gaas Circuit’ Int. J. Elec, 1985, 58, Pp. 324-339