An S-shaped software reliability growth model with two types of errors

Microelectronics Reliability

Volumn 30, Issue 6, 1990, Pages 1085-1090

  Kareer, Nishi ^a   Kapur, P K ^a   Grover, P S ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY - RANDOM PROCESSES; RELIABILITY THEORY;

POISSON PROCESSES; RELIABILITY GROWTH MODEL;

COMPUTER SOFTWARE;

EID: 0025664645     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(90)90285-U     Document Type: Article

References (10)

1. Software reliability models: a review
2. Reliability growth models for hardware and software systems based on nonhomogeneous poisson process: a survey
3. Software reliability models: assumptions, limitations, and applicability
4. Time dependent error detection rate model for software reliability and other performance measures
5. Optimal software release policies with simultaneous cost and reliability requirements
6. Software reliability analysis models
7. Optimum release time for software systems based on reliability and cost criteria
8. Software reliability analysis