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Volumn , Issue , 1990, Pages 374-381
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On the design of path delay fault testable combinational circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
LOGIC CIRCUITS--SYNTHESIS;
EXTENDED FACTORIZATION;
MULTILEVEL LOGIC CIRCUITS;
PATH DELAY FAULT TESTABILITY;
LOGIC CIRCUITS, COMBINATORIAL;
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EID: 0025658543
PISSN: 07313071
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (48)
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References (25)
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