Continuous-flow determination of trace iodine by atmospheric-pressure helium microwave-induced plasma atomic emission spectrometry using generation of volatile iodine from iodide

Applied Spectroscopy

Volumn 44, Issue 10, 1990, Pages 1673-1678

  Nakahara, Taketoshi ^a   Yamada, Syugo ^a   Wasa, Tamotsu ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IODINE--TRACE ANALYSIS;

ANALYTE VOLATILIZATION; ATOMIC EMISSION SPECTROSCOPY; IODINE DETERMINATION;

SPECTROSCOPY, EMISSION;

EID: 0025639355     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702904417553     Document Type: Article

References (39)