A Simulation-Based Method for Generating Tests for Sequential Circuits

IEEE Transactions on Computers

Volumn 39, Issue 12, 1990, Pages 1456-1463

  Cheng, Kwang Ting ^a   Agrawal, Vishwani D ^a   Kuh, Ernest S ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Automatic testing; digital circuits; sequential circuits; simulation; test generation

Indexed keywords

COMPUTER SIMULATION - APPLICATIONS; LOGIC CIRCUITS, SEQUENTIAL - TESTING; SWITCHING THEORY - SEQUENTIAL SWITCHING;

TEST GENERATION;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0025638084     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.61065     Document Type: Article

References (10)

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