Built-in test using perturbed deterministic patterns

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1990, Pages 2232-2235

  Wu, David M ^a   Waicukauski, J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; DATA STORAGE, DIGITAL;

BUILT-IN SELF-TEST; DEVICE UNDER TEST; PERTURBED DETERMINISTIC PATTERNS;

ELECTRON DEVICE TESTING;

EID: 0025629647     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)