Mapping of microdefects in silicon crystals by photoluminescence at room temperature

Proceedings - The Electrochemical Society

Volumn 90, Issue 7, 1990, Pages 994-1004

  Tajima, Michio ^a   Masui, Tsumoru ^a   Abe, Takao ^a  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS--DEFECTS; PHOTOLUMINESCENCE;

MICRODEFECTS; RADIATIVE DEEP LEVELS; SILICON CRYSTALS; SWIRL DEFECTS; THERMAL DONORS;

SEMICONDUCTING SILICON;

EID: 0025628244     PISSN: 01616374     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)