메뉴 건너뛰기




Volumn 37, Issue 6, 1990, Pages 1909-1915

Pulsed laser-induced charge collection in GaAs MESFETs

Author keywords

[No Author keywords available]

Indexed keywords

LASER PULSES; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0025628124     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101208     Document Type: Article
Times cited : (19)

References (13)
  • 5
    • 84956235280 scopus 로고
    • High Speed Photoresponse Mechanism of a GaAs- MESFET
    • T. Sugeta and Y. Mizushima, “High Speed Photoresponse Mechanism of a GaAs- MESFET,” Jpn. J. Appl. Phys. 19, L27 (1980).
    • (1980) Jpn. J. Appl. Phys. , vol.19 , pp. L27
    • Sugeta, T.1    Mizushima, Y.2
  • 7
    • 0017468164 scopus 로고
    • GaAs MESFET: A High-Speed Optical Detector
    • C. Baack, G. Elze, and G. Walf, “GaAs MESFET: A High-Speed Optical Detector,” Electron. Lett. 13, 193 (1977).
    • (1977) Electron. Lett. , vol.13 , pp. 193
    • Baack, C.1    Elze, G.2    Walf, G.3
  • 8
    • 34447345345 scopus 로고
    • Gate Charge Collection and Induced Drain Current in GaAs FETs
    • L.D. Flesner, “Gate Charge Collection and Induced Drain Current in GaAs FETs,” IEEE Trans. Nucl. Sci. NS-32, 4110 (1985).
    • (1985) IEEE Trans. Nucl. Sci. , vol.NS-32 , pp. 4110
    • Flesner, L.D.1
  • 10
    • 0024666348 scopus 로고
    • A Bipolar Mechanism for Alpha-Particle-Induced Soft Errors in GaAs Integrated Circuits
    • Y. Umemoto, N. Matsunaga, and K. Mitsusada, “A Bipolar Mechanism for Alpha-Particle-Induced Soft Errors in GaAs Integrated Circuits,” IEEE Trans. Elect. Dev. ED-36, 864 (1989).
    • (1989) IEEE Trans. Elect. Dev. , vol.ED-36 , pp. 864
    • Umemoto, Y.1    Matsunaga, N.2    Mitsusada, K.3
  • 11
    • 0022290437 scopus 로고
    • Optically Induced, Spatially Resolved Backgating Transients in GaAs FETs
    • T.F. Carruthers, W.T. Anderson, and J.F. Weller, “Optically Induced, Spatially Resolved Backgating Transients in GaAs FETs,” IEDM Technical Digest, 106 (1985).
    • (1985) IEDM Technical Digest , vol.106
    • Carruthers, T.F.1    Anderson, W.T.2    Weller, J.F.3
  • 12
    • 0025434568 scopus 로고
    • Model for Photo-Induced Long-Term Drain Current Transients in GaAs MESFETs
    • P. George, P.K. Ko, and C. Hu, “Model for Photo-Induced Long-Term Drain Current Transients in GaAs MESFETs,” Int. J. Electronics 68, 721 (1990).
    • (1990) Int. J. Electronics , vol.68 , pp. 721
    • George, P.1    Ko, P.K.2    Hu, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.