Noise characterization of a 'surfatron' MIP and the implications for Fourier-transform-based detection in GC-MIP-AES

Applied Spectroscopy

Volumn 44, Issue 10, 1990, Pages 1605-1612

  Sing, Robert L A ^a   Hubert, Joseph ^a  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE, ACOUSTIC--CHARACTERIZATION; PLASMA--NOISE, ACOUSTIC; SPECTROMETRY;

EMISSION SPECTROMETRY; MICROWAVE PLASMA; NOISE SPECTRA; SURFATRON;

SPECTROSCOPY;

EID: 0025628074     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702904417562     Document Type: Article

References (27)