Implementing QML for radiation hardness assurance

IEEE Transactions on Nuclear Science

Volumn 37, Issue 6, 1990, Pages 1794-1805

  Winokur, P S ^a   Sexton, F W ^a   Fleetwood, D M ^a   Terry, M D ^a   Shaneyfelt, M R ^a   Dressendorfer, P V ^a   Schwank, J R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COST ACCOUNTING; SEMICONDUCTOR DEVICES--RADIATION HARDENING; STATISTICAL METHODS;

QUALIFIED MANUFACTURERS LIST METHODOLOGY; SINGLE EVENT UPSETS;

INTEGRATED CIRCUITS;

EID: 0025597505     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101193     Document Type: Article

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