Limit parameters: The general solution of the worst-case problem for the linearized case

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 3, Issue , 1990, Pages 2256-2259

  Muller L , Guntram E ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL STATISTICS--MONTE CARLO METHODS; MATHEMATICAL TECHNIQUES--SENSITIVITY ANALYSIS;

WORST CASE PROBLEMS;

INTEGRATED CIRCUITS;

EID: 0025590486     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)