Aliasing in Signature Analysis Testing with Multiple Input Shift Registers

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 9, Issue 12, 1990, Pages 1344-1353

  Damiani, Maurizio ^a   Olivo, Piero ^a   Favalli, Michele ^a   Ercolani, Silvia ^a   Riccó, Bruno ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Built in self test (BIST); design for testability; linear finite state machines; Markov processes; signature analysis

Indexed keywords

INTEGRATED CIRCUIT TESTING--COMPUTER AIDED ANALYSIS; INTEGRATED CIRCUITS, DIGITAL--TESTING;

BUILT IN SELF TEST; DESIGN FOR TESTABILITY; LINEAR FINITE STATE MACHINES; MARKOV PROCESS; SIGNATURE ANALYSIS; VLSI DESIGN;

INTEGRATED CIRCUITS, VLSI;

EID: 0025590418     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.62779     Document Type: Article

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