-
1
-
-
0002553777
-
Signature analysis: A new digital field services method
-
May
-
R. A. Frohwerk, “Signature analysis: A new digital field services method,” Hewlett-Packard J., pp. 2–8, May 1977.
-
(1977)
Hewlett-Packard J.
, pp. 2-8
-
-
Frohwerk, R.A.1
-
2
-
-
0019027134
-
Built-in test for complex digital integrated circuits
-
B. Koenemann, J. Mucha, and G. Ziehoff, “Built-in test for complex digital integrated circuits,” IEEE J. Solid-State Circuits, vol. SC-15. pp. 315–319, 1980.
-
(1980)
IEEE J. Solid-State Circuits
, vol.SC-15
, pp. 315-319
-
-
Koenemann, B.1
Mucha, J.2
Ziehoff, G.3
-
3
-
-
0021521542
-
LOCST, A built-in self-test technique
-
Nov.
-
J. J. LeBlanc, “LOCST, A built-in self-test technique,” IEEE Design Test, pp. 45–52, Nov. 1984.
-
(1984)
IEEE Design Test
, pp. 45-52
-
-
LeBlanc, J.J.1
-
4
-
-
0023363655
-
Design and test of the 80386
-
June
-
P. P. Gelsinger, “Design and test of the 80386,” IEEE Design Test, pp. 42–50,June 1876.
-
(1876)
IEEE Design Test
, pp. 42-50
-
-
Gelsinger, P.P.1
-
6
-
-
0019029545
-
Measures of the effectiveness of fault signature analysis
-
J. E. Smith, “Measures of the effectiveness of fault signature analysis,” IEEE Trans. Comput., vol. C-29, pp. 510–514, 1980.
-
(1980)
IEEE Trans. Comput.
, vol.C-29
, pp. 510-514
-
-
Smith, J.E.1
-
7
-
-
0016961340
-
Transition count testing of combinational logic networks
-
J. P. Hayes. “Transition count testing of combinational logic networks,” IEEE Trans. Comput., vol. C-25, pp. 613–620, 1976.
-
(1976)
IEEE Trans. Comput.
, vol.C-25
, pp. 613-620
-
-
Hayes, J.P.1
-
8
-
-
0019029565
-
Syndrome-testable design of combinational circuits
-
J. Savir, “Syndrome-testable design of combinational circuits,” IEEE Trans. Comput., vol. C-33, pp. 442–451, 1980.
-
(1980)
IEEE Trans. Comput.
, vol.C-33
, pp. 442-451
-
-
Savir, J.1
-
9
-
-
0020708007
-
Testing by verifying Walsh coefficients
-
J. Suskind, “Testing by verifying Walsh coefficients,” IEEE Trans. Comput., vol. C-35, pp. 198–201, 1983.
-
(1983)
IEEE Trans. Comput.
, vol.C-35
, pp. 198-201
-
-
Suskind, J.1
-
10
-
-
0022700735
-
Accumulator compression testing
-
N. R. Saxena and J. P. Robinson, “Accumulator compression testing,” IEEE Trans. Comput., vol. C-35, pp. 317–321, 1986.
-
(1986)
IEEE Trans. Comput.
, vol.C-35
, pp. 317-321
-
-
Saxena, N.R.1
Robinson, J.P.2
-
11
-
-
0023869357
-
Bounds and analysis of aliasing errors in linear-feedback shift-registers
-
T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, “Bounds and analysis of aliasing errors in linear-feedback shift-registers,” IEEE Trans. Computer-Aided Design, vol. 7, pp. 75–83, 1988.
-
(1988)
IEEE Trans. Computer-Aided Design
, vol.7
, pp. 75-83
-
-
Williams, T.W.1
Daehn, W.2
Gruetzner, M.3
Starke, C.W.4
-
12
-
-
0024767782
-
An analytical model for the aliasing probability in signature analysis testing
-
M. Damiani, P. Olivo, M. Favalli, and B. Ricco, “An analytical model for the aliasing probability in signature analysis testing,” IEEE Trans. Computer-Aided Design, vol. 8, pp. 1133–1145, 1989.
-
(1989)
IEEE Trans. Computer-Aided Design
, vol.8
, pp. 1133-1145
-
-
Damiani, M.1
Olivo, P.2
Favalli, M.3
Ricco, B.4
-
13
-
-
0024128167
-
An iterative technique for calculating aliasing probability of linear feedback signature registers
-
May
-
A. Ivanov and V. K. Agarwal, “An iterative technique for calculating aliasing probability of linear feedback signature registers,” in Proc. FTCS 1988, May 1988, pp. 70–75.
-
(1988)
Proc. FTCS 1988
, pp. 70-75
-
-
Ivanov, A.1
Agarwal, V.K.2
-
14
-
-
0022786257
-
Signature analysis testing for multioutput circuits
-
R. David, “Signature analysis testing for multioutput circuits,” IEEE Trans. Comput., vol. C-35, pp. 830–837, 1986.
-
(1986)
IEEE Trans. Comput.
, vol.C-35
, pp. 830-837
-
-
David, R.1
-
15
-
-
84941860658
-
Aliasing probability for multiple input signature analyzer and a new compression technique
-
Mar.
-
D. K. Pradhan, S. K. Gupta, and M. G. Karpovsky, “Aliasing probability for multiple input signature analyzer and a new compression technique,” in Proc. IEEE BIST Workshop, Mar. 1989.
-
(1989)
Proc. IEEE BIST Workshop
-
-
Pradhan, D.K.1
Gupta, S.K.2
Karpovsky, M.G.3
-
16
-
-
0038111323
-
Analysis and design of linear finite state machines for signature analysis testing
-
to be published.
-
M. Damiani, P. Olivo, and B. Ricco. “Analysis and design of linear finite state machines for signature analysis testing,” IEEE Trans. Comput., to be published.
-
IEEE Trans. Comput.
-
-
Damiani, M.1
Olivo, P.2
Ricco, B.3
-
19
-
-
0021122622
-
Random pattern testability
-
J. Savir, G. S. Ditlow, and P. H. Bardell, “Random pattern testability,” IEEE Trans. Comput., vol. C-33, pp. 79–90, 1984.
-
(1984)
IEEE Trans. Comput.
, vol.C-33
, pp. 79-90
-
-
Savir, J.1
Ditlow, G.S.2
Bardell, P.H.3
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