Mechanism and device-to-device variation of leakage current in polysilicon thin film transistors

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1990, Pages 867-870

  Wu, I Wei ^a   Lewis, Alan G ^a   Huang, Tiao Yuan ^a   Jackson, Warren B ^a   Chiang, Anne ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY; SEMICONDUCTING SILICON;

LOG-NORMAL DISTRIBUTIONS; POLYSILICON TFT; THERMIONIC-FIELD EMISSION;

TRANSISTORS, FIELD EFFECT;

EID: 0025576796     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)