The effects of hot-electron degradation on analog MOSFET performance

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1990, Pages 553-556

  Chung, James E ^a   Quader, Khandker N ^a   Sodini, Charles G ^a   Ko, Ping Keung ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS, DIFFERENTIAL; INTEGRATED CIRCUITS, CMOS; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

HOT-ELECTRON DEGRADATION; SINGLE-ENDED DIFFERENTIAL AMPLIFIERS;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025576484     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)