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Volumn , Issue , 1990, Pages 81-84
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Lateral distribution of interface states in PMOSFET's
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC MEASUREMENTS;
ELECTRONS;
HOT CARRIERS;
SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;
INTERFACE STATES;
NMOSFET;
PMOSFET;
SEMICONDUCTOR DEVICES, MOSFET;
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EID: 0025575396
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (17)
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