A new charge pumping method for determining the spatial interface state density distribution in MOSFETs

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1990, Pages 85-87

  Li, X M ^a   Deen, M J ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CHARGE PUMPING; INTERFACE STATE DENSITY;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025574983     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)