Automatic test generation using quadratic 0-1 programming

27th ACM/IEEE Design Automation Conference. Proceedings 1990

Volumn , Issue , 1990, Pages 654-659

  Chakradhar, Srimat T ^a   Agrawal, Vishwani D ^a   Bushnell, Michael L ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL PROGRAMMING, NONLINEAR - APPLICATIONS; NEURAL NETWORKS - APPLICATIONS;

AUTOMATIC TEST GENERATION (ATG); ENERGY MINIMIZATION PROBLEM; QUADRATIC PROGRAMMING;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0025568128     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/123186.123430     Document Type: Conference Paper

References (14)