Measurement of Frequency Response Functions in Noisy Environments

IEEE Transactions on Instrumentation and Measurement

Volumn 39, Issue 6, 1990, Pages 905-909

  Schoukens, Johan ^a   Pintelon, Rik ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES - TRANSFER FUNCTIONS; MATHEMATICAL TRANSFORMATIONS - FAST FOURIER TRANSFORMS; MEASUREMENT ERRORS; NOISE, SPURIOUS SIGNAL - SIGNAL TO NOISE RATIO; SPECTRUM ANALYZERS;

COHERENCE FUNCTION; FFT ANALYZERS; FREQUENCY RESPONSE FUNCTIONS; LINEAR SYSTEM FREQUENCY RESPONSE; RANDOM ERRORS;

SPECTRUM ANALYSIS;

EID: 0025567236     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.65795     Document Type: Article

References (6)

1. A. G. Bendat and J. S. Piersol, Engineering Applications of Correlation and Spectral Analysis. New York: Wiley, 1980, p. 80.
2. H. Herlufsen, “Dual channel FFT analysis (part 1),” Tech. Rev. Briiel & Kjaer, NO. 1, 1984.
3. D. R. Brillinger, Time Series, Data Analysis, and Theory. New York: Holt, Rinehart and Winston, Inc., 1975.
4. J. Schoukens and J. Renneboog, “Modeling the noise influence on the Fourier coefficients after a discrete Fourier transform,” IEEE Trans. Instrum. Meas., Vol. IM-35, pp. 278-286, Sept. 1986.
5. R. Pintelon, J. Schoukens, and J. Renneboog, “The geometric mean of power (amplitude) spectra has a much smaller bias than the classical arithmetic (RMS) averaging,” IEEE Trans. Instrum. Meas., Vol. 37, pp. 213-218, June 1988.
6. I. S. Gradshteyn and I. M. Ryzhik, Table of Integrals Series and Products. New York: Academic Press, p. 3, eq. 0.151, 1965.