Overview of contamination effects on the performance of high straylight rejection telescopes via ground measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1329, Issue , 1990, Pages 2-15

  Guregian, James J ^a   Benoit, Robert T ^a   Wong, Wallace K ^a  

^a Sensor Systems Group Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DEVICES - CONTAMINATION; SENSORS - OPTICAL PROPERTIES;

IR TELESCOPES; OPTICAL SENSORS; STRAYLIGHT REJECTION TELESCOPES;

TELESCOPES;

EID: 0025556555     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)