Parametric shifts in devices: Role of packaging variables and some novel solutions

Proceedings - Electronic Components and Technology Conference

Volumn 1, Issue , 1990, Pages 322-326

  Pendse, Raj ^a   Jennings, Dean ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; PIEZOELECTRIC DEVICES; RESISTORS; SEMICONDUCTOR DIODES; TRANSISTORS, FIELD EFFECT;

P-TYPE RESISTORS; PIEZOELECTRIC STRAIN GAGES; PRECISION ANALOG DEVICES;

AMPLIFIERS, OPERATIONAL;

EID: 0025556206     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)