Transient Thermal Study of Semiconductor Devices

IEEE Transactions on Components, Hybrids, and Manufacturing Technology

Volumn 13, Issue 4, 1990, Pages 980-988

  Palisoc, Arthur L ^b   Lee, Chin C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b L'GARDE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL TECHNIQUES--BOUNDARY VALUE PROBLEMS; TEMPERATURE DISTRIBUTION; THERMAL ANALYSIS; THERMAL CONDUCTIVITY--COMPUTER AIDED ANALYSIS;

EMBEDDED HEAT SOURCES; MULTILAYER STRUCTURES; SEMI-INFINITE PLATE STRUCTURE; SEMICONDUCTORS; TRANSIENT THERMAL STUDY;

SEMICONDUCTOR DEVICES;

EID: 0025549425     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/33.62539     Document Type: Article

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