Efficient automatic diagnosis of digital circuits

1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers

Volumn , Issue , 1990, Pages 464-467

  Liaw, Heh Tyan ^a   Tsaih, Jia Horng ^a   Lin, Chen Shang ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING--EFFICIENCY; INTEGRATED CIRCUITS, DIGITAL--TESTING;

CIRCUIT TOPOLOGY; DIGITAL CIRCUITS; DIVIDE-AND-CONQUER TECHNIQUE;

ELECTRONIC CIRCUITS;

EID: 0025548653     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)