On component level ESD testing

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn , Issue , 1990, Pages 872-875

  Soohoo, Kwok M ^a   Wu, Chang Yu ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS--PROTECTION; ELECTRIC DISCHARGES; ELECTROMAGNETIC COMPATIBILITY; ELECTRONIC EQUIPMENT--PROTECTION; FIBER OPTICS;

COMPONENT LEVEL ESD TESTING; ELECTROSTATIC DISCHARGE TESTING; FIBER OPTIC LINKS; TRANSVERSE ELECTROMAGNETIC (TEM) CELLS;

ELECTROSTATICS;

EID: 0025539168     PISSN: 01608592     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)