An automated 60 GHz open resonator system for precision dielectric measurement

IEEE Transactions on Microwave Theory and Techniques

Volumn 38, Issue 12, 1990, Pages 1845-1853

  Afsar, Mohammed N ^a   Li, Xiaohui ^a   Chi, Hua ^a  

^a TUFTS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES - LOSS ANGLE MEASUREMENT; OSCILLATORS, GUNN; RESONATORS, CAVITY; SIGNAL GENERATORS; SPECTRUM ANALYZERS;

FABRY-PEROT OPEN RESONATOR; OPEN RESONATOR THEORY; PERMITTIVITY MEASUREMENT; REFRACTIVE INDEX DETERMINATION; TRANSCENDENTAL EQUATIONS;

MICROWAVE MEASUREMENTS;

EID: 0025535623     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.64565     Document Type: Article

References (14)

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3. J. E. Degenford A quasi-optic technique for measuring dielectric loss tangent IEEE Trans. Inst rum. Meas. IM-17 413 417 1968
4. A. L. Cullen P. K. Yu The accurate measurement of permittivity by means of an open resonator Proc. Roy. Soc. A 325 493 509 1971
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11. M. N. Afsar Precision millimeter wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of common polymers IEEE Trans. Instrum. Meas. IM-36 554 561 June 1987
12. M. N. Afsar Precision millimeter wave dielectric measurements of birefringent crystalline sapphire and ceramic alumina IEEE Trans. Instrum. Mens. IM-36 530 536 June 1987
13. M. N. Afsar Dielectric Measurements of millimeter-wave materials IEEE Trans. Microwave Theory Tech. MTT-32 1598 1609 Dec. 1984
14. M. N. Afsar H. Chi X. Li Millimeter wave complex refractive index, complex dielectric permittivity and loss tangent of high purity and compensated silicon Proc. Conf. Precision Eleclrornagn. Meas. 238 239 Proc. Conf. Precision Eleclrornagn. Meas. Ottawa Canada 1990-June-11-14