Linearization of the temperature dependence of the silicon's resistivity for its use as a thermistor

Conference Proceedings - IEEE SOUTHEASTCON

Volumn 3, Issue , 1990, Pages 1095-1099

  Estrada, Horacio V ^a  

^a UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--RESISTANCE; SEMICONDUCTING SILICON--ELECTRIC PROPERTIES; SENSORS; TEMPERATURE MEASUREMENT;

AMPHOTERIC IMPURITIES; METAL BASED SENSORS; RESISTIVITY; SILICON PROCESSING;

THERMISTORS;

EID: 0025531779     PISSN: 07347502     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)