Dielectric resonator method for nondestructive measurement of complex permittivity of microwave dielectric substrates

Conference Proceedings - European Microwave Conference

Volumn 1, Issue 20, 1990, Pages 501-506

  Nishikawa, Toshio ^a   Wakino, Kikuo ^a   Tanaka, Hiroaki ^a   Ishikawa, Youhei ^a  

^a MURATA MANUFACTURING CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; HYBRID INTEGRATED CIRCUITS; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT; PERTURBATION TECHNIQUES; RESONATORS; SUBSTRATES;

COMPLEX PERMITTIVITY; DIELECTRIC SUBSTRATES; TRANSFER ELECTRON MODE;

DIELECTRIC MATERIALS;

EID: 0025527079     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/euma.1990.336092     Document Type: Conference Paper

References (5)