Polarization-Based Material Classification from Specular Reflection

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 12, Issue 11, 1990, Pages 1059-1071

  Wolff, Lawrence B ^a  

^a Department of Computer Science Columbia University ^*  (United States)

Author keywords

Circuit board inspection; computer vision; dielectric metal discrimination; Fresnel reflection coefficients; machine vision; object recognition; polarization reflectance model

Indexed keywords

IMAGE PROCESSING--IMAGE ANALYSIS; INSPECTION; MATERIALS--CLASSIFICATION; PRINTED CIRCUITS--BOARDS; SURFACES--OPTICAL PROPERTIES;

CIRCUIT BOARD INSPECTION; DIELECTRIC/METAL DISCRIMINATION; MACHINE VISION; OBJECT RECOGNITION; SPECULAR REFLECTION;

LIGHT;

EID: 0025521551     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.61705     Document Type: Article

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