Limits of Low Noise Performance of Detector Readout Front Ends in CMOS Technology

IEEE Transactions on Circuits and Systems

Volumn 37, Issue 11, 1990, Pages 1375-1382

  Sansen, Willy M C ^a   Chang, Zhong Yuan ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS; ELECTRONIC CIRCUITS, PULSE SHAPING; INTEGRATED CIRCUITS, CMOS - NOISE, SPURIOUS SIGNAL;

CMOS READOUT FRONT ENDS; EQUIVALENT NOISE CHARGES;

PARTICLE DETECTORS;

EID: 0025517415     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/31.62412     Document Type: Article

References (13)

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