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physica status solidi (a)

Volumn 122, Issue 1, 1990, Pages 97-109

X‐Ray Analysis of Internal Stresses in Crystals II. Lattice Distortions Due to Residual Strains in Crystals Grown from Melts

(2) Indenbom, V L a Kaganer, V M a

a RUSSIAN ACADEMY OF SCIENCES (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING GALLIUM ARSENIDE - STRESSES; SEMICONDUCTOR MATERIALS - GROWTH; STRAIN; X-RAY ANALYSIS;

DISLOCATION DENSITY; INTERNAL STRESSES;

CRYSTALS;

EID: 0025513194 PISSN: 00318965 EISSN: 1521396X Source Type: Journal
DOI: 10.1002/pssa.2211220109 Document Type: Article

Times cited : (7)

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3
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.