Reconciliation of a Hot-Electron Distribution Function with the Lucky Electron-Exponential Model in Silicon

IEEE Electron Device Letters

Volumn 11, Issue 10, 1990, Pages 472-474

  Goldsman, Neil ^a   Henrickson, Lindor ^a   Frey, Jeffrey ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; SEMICONDUCTOR DEVICES, MOSFET;

HOT ELECTRON DISTRIBUTION; IMPACT IONIZATION; LUCKY ELECTRON EXPONENTIAL MODEL;

SEMICONDUCTING SILICON;

EID: 0025505243     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.63000     Document Type: Article

References (12)

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